
Date
-
Place
Campus USFQ, Aula Magna D-128
ESD failure is one of the most devastating reliability problems to ICs and microelectronics products. Recent advances in IC technologies and designs make on-chip ESD protection designs extremely challenging. For more than five decades, vast efforts have been devoted to research and development in ESD protection designs. This lecture discusses all aspects on ESD protection designs for ICs, including ESD